Caption: Left: reconstructed ICM parameters maps for C2 at z ∼ 0.1 using the multi-band fit presented in Sect. 4.6 (Cucchetti et al. 2018) with S/N ∼ 300 (∼90 000 counts per spatial bin). Middle: distribution within the regions j of (Pj − Pin, j)/σj indicating the goodness of the fit for each region in terms of σj (see Sect. 4.6). Right: relative error distribution across all spectral regions (green histogram). The red solid line pictures the Gaussian best fit. The vertical blue dashed lines are set at the mean value of the fit errors (see Sect. 4.6, Cucchetti et al. 2018). From top to bottom: spectroscopic temperature Tsl (in keV), emission-measure-weighted abundances of Oxygen (O), Silicon (Si) and Iron (Fe) (with respect to solar).

Additional comments: Figure reproduced from Cucchetti et al. 2018 (A&A, 620, A173).

Credits for data/References: Cucchetti et al., 2018, A&A 620, A173.

Creation date: 14/12/2020. Version #: 2.

Credits: X-IFU Consortium. Copyrights: © DB/X-IFU.